Crystal Impact Match v1.10b 粉末衍射資料階段識別軟體 英文破解版   破解說明:安裝完成後,請將光碟\crack目錄下的檔案,複製到主程式的 安裝目錄內中,並覆蓋,即可破解! 軟體簡介:   Crystal.Impact.Match.v1.10是一款易用的粉末衍射資料階段識別軟體。通過把 樣本的粉末衍射形態與資料庫中的參考形態進行比較,來確定樣本所在階段。通 過提升ICSD(無機晶體結構資料庫)的檢索效率,提高參考模式資料庫的價值。 Match!isaneasy-to-usesoftwareforphaseidentificationfrompowder diffractiondata,whichhasbecomeadailytaskinmaterialscientists work.Match!comparesthepowderdiffractionpatternofyoursampleto adatabasecontainingreferencepatternsinordertoidentifythephases whicharepresent.Singleaswellasmultiplephasescanbeidentified basedonbothpeakdataandraw(profile)data. Asreferencedatabase,youcanapplytheincludedfree-of-chargeCOD databaseand/orICSD/Retrieve(ifyouhaveavalidlicence),useany ICDDPDFproduct,and/orcreateauserdatabasebasedonyourown diffractionpatterns.Theuserdatabasepatternscanbeeditedmanually, importedfrompeakfiles,calculatedfromcrystalstructuredata(e.g. CIFfiles),orimportedfromyourcolleague'suserdatabase. AlistofMatch!'smostprominentfeaturescanbefoundhere. Match!FunctionList Fastsingleandmultiplephaseidentificationfrompowderdiffractiondata Usefree-of-chargereferencepatternscalculatedfromtheCOD(incl.I/Ic), anyICDDPDFdatabase,anyICSD/Retrieveversion(released1993-2002;valid licencerequired)and/oryourowndiffractiondata(orpatternscalculated fromcrystalstructuredata(e.g.CIFfiles))inphaseidentification Flexiblehandlingofreferencedatabases(incl.userdatabases);youcan easilyswitchbetweendifferentreferencedatabaseswithoutthenecessity toperformanewdatabaseindexation CreatereferencedatabasesforX-rayandneutrondiffractione.g.fromcif-files Comfortableuserdatabasemanagerforeasymaintenanceofuserdata(add/ import/edit/delete/sortentries) PowerfulCIF-andICSD/Retrieveimport,incl.calculationofpowderpattern, I/Icanddensity Atomiccoordinatesavailablee.g.intheICSD,theICDDPDF-4+orfree-of- chargereferencedataaredisplayedinthedatasheetsandincludedinthe CIF-orTextfile-exports(e.g.forRietveldanalysis) DisplayingofMillerindices(hkl)indiffractionpatternsandentrydata sheets ViewcrystalstructuresinDiamondwithjustafewclicks FullyintegratedhandlingofyourowndiffractiondatawithPDFdata( search-match,retrieval,dataviewing) Automaticresidualsearchingwithrespecttoidentifiedphases Automaticrawdataprocessing:α2-stripping,backgroundsubtraction,peak search,profilefitting,errorcorrection Automaticoptimizationofpeaksearchingsensitivity Fittingofall(orselected)peakparameterstoexp.profiledata Comfortablemanualeditingofpeaks(add/shift/delete/fit)usingmouseor keyboard Semi-quantitativeanalysis(ReferenceIntensityRatiomethod) Straight-forwardusageofadditionalknowledge(composition,PDFsubfiles, crystallographicdata,color,densityetc.) IntegrateddatabaseretrievalsystemandviewerforPDFanduserdatasheets Multiplestepundo/redo SupportfornewPDFentrynumbers(9digits) User-configurableautomaticoperation Fullparametercontrolwithinstantrearrangementoftheresultslist Automaticd-valueshiftingduringsearch-matchprocess(optionally) Intensitycontributiontofigure-of-meritcanbereducedforpreferred-orientationcases Comfortablegraphicalandtabularcomparisonofpeakdataandcandidatepatterns Mouse-controlledpatterngraphicszoomingandtracking User-configurableHTML-reports Onlineupdate(automaticormanual) Supporteddiffractiondatafileformats(automaticdetection): ASCIIprofile(start,step,intensitiesor2columns) Bruker/Siemensrawdata(oldandnew)(*.raw) Bruker/SiemensDIFFRACATpeakdata(*.dif) DBWS(*.rfl,*.dat) ENDEAVOURpeaklist(2columns:2theta/dintensity;*.dif) Inelrawdata(*.dat) ItalStructuresrawdata(*.esg) Jade/MDI/SCINTAGrawdata(*.mdi) JEOLASCIIExportrawdata(*.txt) PANalyticalXRDMLScanrawdata(*.xrdml) PANalytical/Philipspeakdata(*.udi) PANalytical/Philipsrawdata(*.rd,*.udf) Rigakurawdata(*.raw) SCINTAGrawdata(*.raw,*.rd) Shimadzurawdata(*.raw) Siemens(*.uxd) SietronicsXRDscandata(*.cpi) Stoerawdata(*.raw) Stoepeakdata(*.pks)